Biblioteca - Ingemmet

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Hayashi, Ken-Ichiro

Quantitative analysis of fluid inclusions by synchrotron X-ray fluorescence: calibration of Cu and Zn in synthetic quartz inclusions - Stuttgart E. Schweizerbart'sche Verlagsbuchhandlung May-June 2006 - pp. 309-318 ilus., tbls

Subjects--Topical Terms:
ELEMENTOS TRAZA
FLUORESCENCIA DE RAYOS X
INCLUSIONES FLUIDAS
MICROANALISIS
RADIACION SINCROTONICA
S^Cobre
S^Cuarzo
S^Zinc